MEMS Reliability Assurance Guidelines for Space Applications
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منابع مشابه
High Power (>1W) Application RF MEMS Lifetime Performance Evaluation
1.0 INTRODUCTION Solid-state RF devices are currently utilized in a wide array of application areas, including satellite communications systems, wireless communications systems, automotive radars, and defense applications. Currently, PIN diode or Field Effect Transistor (FET)-based switches are utilized for their high switching speeds, high power handling, low drive voltage, low cost, and techn...
متن کاملReliability of Mems (microsystems) for Space Applications
With their extremely low mass and volume, low power consumption and tight integration with electronics, MEMS (microsystems) sensors and actuators are extremely appealing for reducing the size and mass of spacecraft without sacrificing functionality. In view of the harsh and remote environment of space, reliability and qualification is the crucial issues that are holding back MEMS from playing a...
متن کاملReliability of MEMS for space applications
With their extremely low mass and volume, low power consumption and tight integration with electronics, MEMS sensors and actuators are extremely appealing for reducing the size and mass of spacecraft without sacrificing functionality. In view of the harsh and remote environment of space, reliability and qualification is the crucial issues that are holding back MEMS from playing a larger role in...
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As the Army transforms into a more lethal, lighter and agile force, the technologies that support these systems must decrease in size while increasing in intelligence. Microelectromechanical systems (MEMS) are one such technology that the Army and DOD will rely on heavily to achieve these objectives. The MEMS devices within these systems will be required to last as long as the lifetime of the w...
متن کاملApplication of Pulsed Digital Oscillators (pdo) to the In-situ Mechanical Test of Mems for Space Applications
The objective of this work is to propose Pulsed Digital Oscillators as a possible tool for the in situ monitoring of MEMS in space applications. The reliability of MEMS devices is an important issue for space applications. These devices are prone to mechanical as well as electrical damages. Although extensive knowledge exists on the failure mechanisms of microelectronic devices, there is no sta...
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تاریخ انتشار 1999